The fast growth in the applications of electronic products has created an increasing demand for reputable methods for examining and characterizing these products. This book checks out the area of x-ray diffraction and the techniques offered for deployment in research, development, and production. It maps the theoretical and practical background essential to study single crystal products using high resolution x-ray diffraction and topography. It combines mathematical formalism with visual explanations and hands-on advice for interpreting information, hence offering the theoretical and useful background for using these methods in clinical and industrial materials characterization
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