This book introduces and details the crucial aspects of Combined Analysis – an x-ray and/or neutron scattering method which integrates structural, textural, tension, microstructural, phase, layer, or other pertinent variable or residential or commercial property analyses in a single technique. Discussed are microstructures of powder diffraction profiles; quantitative phase analysis from the Rietveld analysis; residual stress analysis for isotropic and anisotropic products; specular x-ray reflectivity, and the various involved designs.
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